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Search results for biblio_type:Proceedings, non-refereed
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2013
G. Fraser, M. Staats, P. McMinn, A. Arcuri and F. Padberg. Does Automated White-Box Test Generation Really Help Software Testers? In ACM International Conference on Software Testing and Analysis (ISSTA), Edited by M. Harman. New York, NY, USA: ACM, 2013.
S. Wang, S. Ali and A. Gotlieb. Minimizing Test Suites in Software Product Lines Using Weight-Based Genetic Algorithms In ACM Genetic and Evolutionary Computation Conference (GECCO), Edited by M. Harman. New York, NY, USA: ACM, 2013.