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A. Hervieu and A. Gotlieb. PACOGEN: Automatic Generation of Pairwise Test Configurations From Feature Models In Proceedings of the IEEE 22nd International Symposium on Software Reliability Engineering (ISSRE 2011), Edited by B. Cukic. Hiroshima: IEEE Computer Society, 2011.PDF icon Simula.simula.876.pdf (374.16 KB)