Modelling and Testing Cyber-Physical Systems: Robustness, Product Line and Self * Properties

Modelling and Testing Cyber-Physical Systems: Robustness, Product Line and Self * Properties

Modelling and Testing Cyber-Physical Systems: Robustness, Product Line and Self * Properties

Authors: S. Ali and T. Yue
Status: Published
Publication type: Talks Invited
Year of publication: 2015
Journal: Ericsson, Sweden
Publisher: -
Citation key: 14111

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