Learning a Bayesian Surrogate Model for Measuring Test Coverage in Automated Driving Systems
- Authors
- P. Greau-Hamard, F. Adjed, A. Gotlieb and M. Ibn Khedher
- Status
- Accepted
- Publication type
- Conference Proceedings
- Year of publication
- 2026
- Journal
- IEEE 50th Conference on Computers, Software, and Applications (COMPSAC'26) - Madrid, Spain, July 7-10, 2026
- Publisher
- -
- Citation key
- 18642