- Authors
- S. Ali, T. Yue, A. B. Bagnato, E. Brosse, Z. R. Dai, A. Hoffmann, M. Wendland and M. Schacher
- Editors
- I. Schieferdecker
- Status
- Published
- Publication type
- Proceedings Refereed
- Year of publication
- 2014
- Journal
- 2nd International Workshop on Risk Assessment and Risk-driven Testing (RISK 2014)
- Publisher
- IEEE
- Citation key
- 8775