- Authors
- J. E. Hannay and H. C. Benestad
- Editors
- M. G. Succi and N. Nagappan
- Status
- Published
- Publication type
- Proceedings Refereed
- Year of publication
- 2010
- Journal
- International Symposium on Empirical Software Engineering and Measurement (ESEM 2010)
- Publisher
- ACM
- Citation key
- 9749