Uncertainty-wise Test Case Generation and Minimization for Cyber-Physical Systems

Uncertainty-wise Test Case Generation and Minimization for Cyber-Physical Systems

Uncertainty-wise Test Case Generation and Minimization for Cyber-Physical Systems

Authors: M. Zhang, S. Ali and T. Yue
Status: Published
Publication type: Presentation
Year of publication: 2019
Journal: 34th IEEE/ACM International Conference on Automated Software Engineering (ASE 2019), San Diego (CA), USA
Publisher: ACM
Citation key: 15559

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