Uncertainty-wise Test Case Generation and Minimization for CyberPhysical Systems

Uncertainty-wise Test Case Generation and Minimization for CyberPhysical Systems

Uncertainty-wise Test Case Generation and Minimization for CyberPhysical Systems

Authors: M. Zhang, S. Ali and T. Yue
Status: Published
Publication type: Journal Article
Year of publication: 2019
Journal: Journal of Systems and Software
Publisher: Elsevier
Citation key: 15319

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