Zen-RUCM and Restricted Test Case Specification and Generation (RTCM)

Zen-RUCM and Restricted Test Case Specification and Generation (RTCM)

Zen-RUCM and Restricted Test Case Specification and Generation (RTCM)

Authors: T. Yue and M. Zhang
Status: Published
Publication type: Talks Invited
Year of publication: 2017
Journal: Huawei 2012 Lab at Beijing, China
Publisher: -
Citation key: 14851

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