Black-Box System Testing of Real-Time Embedded Systems Using Random and Search-Based Testing
- Authors
- A. Arcuri, M. Z. Iqbal and L. Briand
- Editors
- A. Petrenko, A. Simão and J. Maldonado
- Status
- Published
- Publication type
- Proceedings Refereed
- Year of publication
- 2010
- Journal
- 22nd IFIP International Conference on Testing Software and Systems (ICTSS) - formerly TestCom/FATES
- Publisher
- Springer
- Citation key
- 9741