Quito: a Coverage-Guided Test Generator for Quantum Programs

Quito: a Coverage-Guided Test Generator for Quantum Programs

Authors: X. Wang, P. Arcaini, T. Yue and S. Ali
Status: Published
Publication type: Proceedings Refereed
Year of publication: 2021
Journal: 2021 36th IEEE/ACM International Conference on Automated Software Engineering (ASE)
Publisher: IEEE
URL: https://ieeexplore.ieee.org/document/9678798
DOI: 0.1109/ASE51524.2021.9678798
Citation key: 16819

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