Test Case Minimization with Quantum AnnealersAuthorsX. Wang, A. Muqeet, T. Yue, S. Ali and P. ArcainiStatusPublishedPublication typeJournal ArticleYear of publication2024JournalACM Transactions on Software Engineering and MethodologyPublisherAssociation for Computing Machinery (ACM)DOIhttps://doi.org/10.1145/3680467Citation key17797Google Scholar BibTex