Uncertainty-wise Test Case Generation and Minimization for Cyber-Physical Systems
- Authors
- M. Zhang, S. Ali and T. Yue
- Status
- Published
- Publication type
- Presentation
- Year of publication
- 2019
- Journal
- 34th IEEE/ACM International Conference on Automated Software Engineering (ASE 2019), San Diego (CA), USA
- Publisher
- ACM
- Citation key
- 15559