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Selected publications

In Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis. New York, NY, USA: ACM, 2017.
Proceedings, refereed
2017
Software: Practice and Experience 49, no. 2 (2019): 192-213.
Journal Article
2019
AI Magazine 38, no. Spring (2017).
Journal Article
2017
In Advances in Computers, 67-101. ADCOM, UK: Academic Press ed. Vol. 99. Elsevier, 2015.
Book Chapter
2015

Awards

Best Paper Award for " A New Approach to Feature-based Test Suite Reduction in Software Product Line Testing"
in the 11th International Joint Conference on Software Technologies, ICSOFT-EA 2016, Lisbon, Portugal
July 2016
Best Application Paper Award for "Using CP in automatic test generation for ABB robotics' paint control systems" In Principles and Practice of Constraint Programming
The 20th International Conference on Principles and Practice of Constraint Programming, Lyon, France
September 2014
Best Application Paper Award for "Automated test case selection using feature model: An industrial case study."
ACM/IEEE 16th Int. Conf. on Model Driven Eng. Languages and Systems (MODELS'13), Miami, Florida.
July 2013

Students under supervision

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2020

Journal articles

Int. Journal on Artificial Intelligence Tools (IJAIT) 29, no. 3-4 (2020): 23.
Status: Published
Journal of Systems and Software (2020).
Status: Published

Proceedings, refereed

In 1st International Workshop on New Foundations for Human-Centered AI @ ECAI 2020, 2020.
Status: Accepted
In The Thirty-Fourth AAAI Conference on Artificial Intelligence. AAAI'20: AAAI, 2020.
Status: Published
In The IEEE Second International Conference On Artificial Intelligence Testing (AITest 2020). IEEE, 2020.
Status: Published
In The 46th Euromicro Conference on Software Engineering and Advanced Applications (SEAA). Euromicro, 2020.
Status: Published
In The 6th International Conference on Machine Learning, Optimization and Data Science - LOD 2020, 2020.
Status: Accepted
2019

Journal articles

Software: Practice and Experience 49, no. 2 (2019): 192-213.
Status: Published

Proceedings, refereed

In 2019 IEEE International Conference On Artificial Intelligence Testing (AITest). San Francisco, CA, USA: IEEE, 2019.
Status: Published
In 2019 IEEE International Conference On Artificial Intelligence Testing (AITest). IEEE, 2019.
Status: Published