AuthorsL. Moonen, F. Khomh, H. Washizaki, Y. Guéhéneuc and G. Antoniol
TitleProceedings of the Third International Workshop on Patterns Promotion and Anti-patterns Prevention
AfilliationSoftware Engineering
StatusPublished
Publication TypeEdited books
Year of Publication2016
Secondary TitleProceedings of the 23rd IEEE International Conference on Software Analysis, Evolution, and Reengineering (SANER)
Volume4
Number of Volumes5
Number of pages in booki-14
Date PublishedMarch
PublisherIEEE
Abstract

Patterns are proven solutions to problems that reoccur in certain contexts whereas anti-patterns are their opposite, i.e., known poor practices. It has been over two decades since design patterns and anti-patterns were introduced in software engineering and a well-established body of work has been created on the definition, detection, application, and impact of design patterns and anti-patterns. In the SANER community, patterns and anti-patterns are widely studied in relation to program comprehension, software maintenance, and more generally software quality. Yet, limited feedback exists on the extent to which practitioners benefit from this body of work. The third edition of the PPAP workshop aims to promote patterns and prevent anti-patterns in practice. Concretely, it aims to bring together practitioners, researchers, and students to discuss challenges and opportunities surrounding (anti-)patterns in software evolution and to develop a road-map to further the promotion of patterns and the prevention of anti-patterns.

URLhttp://ieeexplore.ieee.org/xpl/tocresult.jsp?isnumber=7476733
DOI10.1109/SANER.2016.126
Citation Key24923

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