Automated Product Line Methodologies to Support Model-Based Testing
- Authors
- S. Wang, S. Ali and A. Gotlieb
- Editors
- T. Tse
- Status
- Published
- Publication type
- Proceedings Refereed
- Year of publication
- 2013
- Journal
- The ACM/IEEE 16th International Conference on Model Driven Engineering Languages and Systems (MODELS), online publication at CEUR
- Publisher
- IEEE
- Citation key
- 8804