MuTIL: Mutation-Based Statistical Test Inputs Generation for Automatic Fault Localization
- Authors
- M. Delahaye, L. C. Briand, A. Gotlieb and M. Petit
- Status
- Published
- Publication type
- Proceedings Refereed
- Year of publication
- 2012
- Journal
- Proceedings of the Sixth International Conference on Software Security and Reliability (SERE-12), Washington, USA
- Publisher
- .
- Citation key
- 8712