Proceedings International Workshop on Testing in XP (WTiXP)

Proceedings International Workshop on Testing in XP (WTiXP)

Proceedings International Workshop on Testing in XP (WTiXP)

Authors: L. Moonen
Status: Published
Publication type: Edited Books
Year of publication: 2002
Journal: -
Publisher: Centrum voor Wiskunde en Informatica (CWI)
Citation key: 12369

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