Towards More Reliable Automated Program Repair by Integrating Static Analysis Techniques
- Authors
- O. I. Al-Bataineh, A. Grishina and L. Moonen
- Status
- Published
- Publication type
- Proceedings Refereed
- Year of publication
- 2021
- Journal
- 21st IEEE International Conference on Software Quality, Reliability, and Security
- Publisher
- IEEE
- Citation key
- 16325