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In Proceedings of the 1st IEEE Artificial Intelligence Testing Conference (AI Test 2019). San Francisco, CA, USA: IEEE, 2019.
Proceedings, refereed
2019
In Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis. New York, NY, USA: ACM, 2017.
Proceedings, refereed
2017
In International Conference on Software Testing, Verification and Validation (ICST 2017) . IEEE, 2017.
Proceedings, refereed
2017

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2019

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Proceedings, refereed

In Proceedings of the 1st IEEE Artificial Intelligence Testing Conference (AI Test 2019). San Francisco, CA, USA: IEEE, 2019.
Status: Published
2017

Proceedings, refereed

In IEEE International Symposium on High Assurance Systems Engineering. ACM/IEEE, 2017.
Status: Published
In IEEE International Symposium on High Assurance Systems Engineering. ACM/IEEE, 2017.
Status: Published
In International Conference on Software Testing, Verification and Validation (ICST 2017) . IEEE, 2017.
Status: Published
In Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis. New York, NY, USA: ACM, 2017.
Status: Published